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1 Ergebnisse
1
Investigation of Electrical Characteristics of a Fabricated..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Lu, Yupeng
;
Sun, Peng
;
Yan, Gangping
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531874
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>Investigation of Electrical Characteristics of a Fabricated Lgad Detectors at High and Low Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10531874&Exemplar=1&LAN=DE A1 Lu, Yupeng A1 Sun, Peng A1 Yan, Gangping A1 Zhang, Luoyun A1 Yang, Yanyu A1 Liu, Shuang A1 Xu, Gaobo A1 Yin, Huaxiang YR 2024 K1 Integrated circuits K1 Temperature K1 Manufacturing processes K1 Cooling K1 Detectors K1 Dark current K1 Electric variables SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531874 DO https://doi.org/10.1109/CSTIC61820.2024.10531874 SF ELIB - SuUB Bremen
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