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1 Ergebnisse
1
Study on Failure Mechanism of C4 Bump Solder Excursion in C..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Wei, Xixiong
;
Lin, Xinyi
;
Zhou, Shilu
.. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531879
RT T1
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
: T1
Study on Failure Mechanism of C4 Bump Solder Excursion in CoWoS Package
UL https://suche.suub.uni-bremen.de/peid=ieee-10531879&Exemplar=1&LAN=DE A1 Wei, Xixiong A1 Lin, Xinyi A1 Zhou, Shilu A1 Yang, Dan A1 Mei, Na YR 2024 K1 Integrated circuits K1 Semiconductor device modeling K1 Moore's Law K1 Failure analysis K1 Packaging K1 Reflectometry K1 Market research K1 Solder excursion K1 CoWoS (Chip on Wafer on Substrate) K1 Under-fill delamination K1 Time Domain Reflectometry (TDR) SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531879 DO https://doi.org/10.1109/CSTIC61820.2024.10531879 SF ELIB - SuUB Bremen
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