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1 Ergebnisse
1
Potential Confusion in the Analysis of the Current-Voltage ..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Lau, W.S.
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531938
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>Potential Confusion in the Analysis of the Current-Voltage Characteristics of High-K Dielectric on Lightly Doped P-Type Silicon MIS Capacitors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10531938&Exemplar=1&LAN=DE A1 Lau, W.S. YR 2024 K1 Integrated circuits K1 MISFETs K1 Capacitors K1 Lighting K1 Metals K1 Logic gates K1 Silicon SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531938 DO https://doi.org/10.1109/CSTIC61820.2024.10531938 SF ELIB - SuUB Bremen
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