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1 Ergebnisse
1
Anomalous Hot Carrier Injection Induced Degradation of Drai..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Zhao, Bocheng
;
Tian, Zhi
;
Wang, Qiwei
. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531943
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>Anomalous Hot Carrier Injection Induced Degradation of Drain Current in High-Voltage NMOS with Shallow Trench Isolation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10531943&Exemplar=1&LAN=DE A1 Zhao, Bocheng A1 Tian, Zhi A1 Wang, Qiwei A1 Zhang, Jianhua YR 2024 K1 Degradation K1 Manufacturing processes K1 High-voltage techniques K1 Doping K1 Voltage K1 Logic gates K1 Hot carrier injection K1 HVMOS K1 HCI K1 STI K1 Device degradation K1 Kirk effect SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531943 DO https://doi.org/10.1109/CSTIC61820.2024.10531943 SF ELIB - SuUB Bremen
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