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1 Ergebnisse
1
Modeling of Endurance Degradation of Anti-Ferroelectric HF1..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Ding, Yaru
;
Huo, Yuetong
;
Yan, Chu
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10531963
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>Modeling of Endurance Degradation of Anti-Ferroelectric HF1-xZRxO2 Capacitors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10531963&Exemplar=1&LAN=DE A1 Ding, Yaru A1 Huo, Yuetong A1 Yan, Chu A1 Weng, Zeping A1 Li, Jianguo A1 Lan, Zhangsheng A1 Qu, Yiming A1 Zhao, Yi YR 2024 K1 Degradation K1 Nonvolatile memory K1 Capacitors K1 Random access memory K1 Switches K1 Predictive models K1 Gaussian distribution SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10531963 DO https://doi.org/10.1109/CSTIC61820.2024.10531963 SF ELIB - SuUB Bremen
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