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Investigation on the Root Cause of ESD Failure of Large Siz..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
Zhang, Yunhe ; Lin, Shaobing ; Chao, Shuanshe... - p. 1-3 , 2024
Link: https://doi.org/10.1109/CSTIC61820.2024.10532036