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1
New Methodology for Anisotropic Nanoparticles Characterizat..:
, In:
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
,
Maxit, Benoit
;
Catros, Clara
;
Mener, Julien Le
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/CSTIC61820.2024.10532087
RT T1 <cTitle>2024 Conference of Science and Technology for Integrated Circuits (CSTIC)</cTitle>: T1 <Title>New Methodology for Anisotropic Nanoparticles Characterization by Depolarized Light Scattering Measurements: Length and Diameter Determination of Rod-Like Nanoparticles</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10532087&Exemplar=1&LAN=DE A1 Maxit, Benoit A1 Catros, Clara A1 Mener, Julien Le A1 Aubrit, Florian A1 Sandre, Olivier A1 Jacob, David A1 Boj, Sylvain YR 2024 K1 Nanoparticles K1 Integrated circuits K1 Fluctuations K1 Light scattering K1 Anisotropic K1 Length measurement K1 Size measurement SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC61820.2024.10532087 DO https://doi.org/10.1109/CSTIC61820.2024.10532087 SF ELIB - SuUB Bremen
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