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1 Ergebnisse
1
Comparative Study of Nanowire FET & Internal Gate Nanowire ..:
, In:
2024 2nd International Conference on Device Intelligence, Computing and Communication Technologies (DICCT)
,
Rajyan, Abhinav
;
Matin
;
Saini, Gaurav
- p. 1-5 , 2024
Link:
https://doi.org/10.1109/DICCT61038.2024.10532940
RT T1 <cTitle>2024 2nd International Conference on Device Intelligence, Computing and Communication Technologies (DICCT)</cTitle>: T1 <Title>Comparative Study of Nanowire FET & Internal Gate Nanowire FET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10532940&Exemplar=1&LAN=DE A1 Rajyan, Abhinav A1 Matin A1 Saini, Gaurav YR 2024 K1 Performance evaluation K1 Voltage measurement K1 Sensitivity K1 Field effect transistors K1 Switches K1 Logic gates K1 Nanoscale devices K1 Drain-Induced Barrier Lowering K1 Nanowire Field Effect Transistor K1 Short-channel effects (SCEs) K1 Gate All-Around (GAA) Devices K1 Subthreshold Swing SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/DICCT61038.2024.10532940 DO https://doi.org/10.1109/DICCT61038.2024.10532940 SF ELIB - SuUB Bremen
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