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1
Cryogenic Behaviors of 65nm Transistor: On-State IV and Par..:
, In:
2024 IEEE Workshop on Microelectronics and Electron Devices (WMED)
,
Huang, Po Shao
;
Shah, Sahil
;
Sharka, Alhaji A
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/WMED61554.2024.10534143
RT T1 <cTitle>2024 IEEE Workshop on Microelectronics and Electron Devices (WMED)</cTitle>: T1 <Title>Cryogenic Behaviors of 65nm Transistor: On-State IV and Parameters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10534143&Exemplar=1&LAN=DE A1 Huang, Po Shao A1 Shah, Sahil A1 Sharka, Alhaji A A1 Kengni, Gilbert A1 Masuoka, Yuri A1 Wong, Hiu Yung YR 2024 SN 1947-3842 K1 Resistance K1 MOSFET K1 Current measurement K1 Wires K1 Cryogenics K1 Analog circuits K1 Size measurement K1 Analog Circuit K1 BSIM K1 Compact Model K1 Cryogenic CMOS K1 Empirical Model K1 Variability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/WMED61554.2024.10534143 DO https://doi.org/10.1109/WMED61554.2024.10534143 SF ELIB - SuUB Bremen
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