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1 Ergebnisse
1
Reliability Assessment of Arm Cortex-M Processors under Hea..:
, In:
2024 IEEE 25th Latin American Test Symposium (LATS)
,
Gobatto, Leonardo R.
;
Benevenuti, Fabio
;
Added, Nemitala
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/LATS62223.2024.10534599
RT T1
2024 IEEE 25th Latin American Test Symposium (LATS)
: T1
Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection
UL https://suche.suub.uni-bremen.de/peid=ieee-10534599&Exemplar=1&LAN=DE A1 Gobatto, Leonardo R. A1 Benevenuti, Fabio A1 Added, Nemitala A1 Alberton, Saulo G. A1 Macchione, Eduardo L. A. A1 Aguiar, Vitor A. P. A1 Medina, Nilberto H. A1 Kastensmidt, Fernanda L. A1 Azambuja, Jose Rodrigo YR 2024 K1 Radiation effects K1 Fault tolerance K1 Program processors K1 Systematics K1 Operating systems K1 Fault tolerant systems K1 Benchmark testing K1 fault injection K1 embedded processors K1 radiation K1 heavy ions SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/LATS62223.2024.10534599 DO https://doi.org/10.1109/LATS62223.2024.10534599 SF ELIB - SuUB Bremen
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