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1 Ergebnisse
1
Ultra-Sensitive Visualization and Identification of Defects..:
, In:
2024 International Conference on Electronics Packaging (ICEP)
,
Lo, Michael K. F.
;
Dillon, Eoghan P.
;
Anderson, Jay
- p. 223-224 , 2024
Link:
https://doi.org/10.23919/ICEP61562.2024.10535676
RT T1 <cTitle>2024 International Conference on Electronics Packaging (ICEP)</cTitle>: T1 <Title>Ultra-Sensitive Visualization and Identification of Defects in Microelectronics Packaging</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10535676&Exemplar=1&LAN=DE A1 Lo, Michael K. F. A1 Dillon, Eoghan P. A1 Anderson, Jay YR 2024 K1 Integrated optics K1 Lighting K1 Packaging K1 Fluorescence K1 Optical imaging K1 Optical pumping K1 Microelectronics K1 sub-micron K1 infrared K1 pump-probe K1 O-PTIR K1 contamination SP 223 OP 224 LK http://dx.doi.org/https://doi.org/10.23919/ICEP61562.2024.10535676 DO https://doi.org/10.23919/ICEP61562.2024.10535676 SF ELIB - SuUB Bremen
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