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1 Ergebnisse
1
Enhanced reliability and trapping behavior in ferroelectric..:
, In:
2024 IEEE International Memory Workshop (IMW)
,
Lederer, Maximilian
;
Muller, Franz
;
Hoffmann, Raik
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/IMW59701.2024.10536975
RT T1
2024 IEEE International Memory Workshop (IMW)
: T1
Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions
UL https://suche.suub.uni-bremen.de/peid=ieee-10536975&Exemplar=1&LAN=DE A1 Lederer, Maximilian A1 Muller, Franz A1 Hoffmann, Raik A1 Olivo, Ricardo A1 Raffel, Yannick A1 Yang, Shouzhuo A1 De, Sourav A1 Potjan, Roman A1 Ostien, Oliver A1 Altawil, Abdelrahman A1 Sunbul, Ayse A1 Lehninger, David A1 Kampfe, Thomas A1 Seidel, Konrad YR 2024 SN 2573-7503 K1 Quantum computing K1 Nonvolatile memory K1 Conferences K1 Space cooling K1 Cryogenics K1 Hafnium oxide K1 Reliability K1 ferroelectric field-effect transistor (FeFET) K1 cryogenic K1 interface traps K1 endurance K1 retention SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IMW59701.2024.10536975 DO https://doi.org/10.1109/IMW59701.2024.10536975 SF ELIB - SuUB Bremen
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