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1 Ergebnisse
1
Testability Considerations for Custom Processing-In-Memory ..:
, In:
2024 12th International Electrical Engineering Congress (iEECON)
,
Grout, Ian
- p. 1-4 , 2024
Link:
https://doi.org/10.1109/iEECON60677.2024.10537816
RT T1 <cTitle>2024 12th International Electrical Engineering Congress (iEECON)</cTitle>: T1 <Title>Testability Considerations for Custom Processing-In-Memory Cores</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10537816&Exemplar=1&LAN=DE A1 Grout, Ian YR 2024 K1 Geometry K1 Fabrication K1 Circuits and systems K1 Random access memory K1 Integrated circuit interconnections K1 Hardware K1 Delays K1 test K1 Processing-in-Memory K1 Design for Test K1 Built-In Self-Test K1 IEEE Std 1500 SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/iEECON60677.2024.10537816 DO https://doi.org/10.1109/iEECON60677.2024.10537816 SF ELIB - SuUB Bremen
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