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1 Ergebnisse
1
Built in self test (BIST) for RSFQ circuits:
, In:
2024 IEEE 42nd VLSI Test Symposium (VTS)
,
Li, Mingye
;
Lin, Yunkun
;
Gupta, Sandeep
- p. 1-7 , 2024
Link:
https://doi.org/10.1109/VTS60656.2024.10538849
RT T1
2024 IEEE 42nd VLSI Test Symposium (VTS)
: T1
Built in self test (BIST) for RSFQ circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-10538849&Exemplar=1&LAN=DE A1 Li, Mingye A1 Lin, Yunkun A1 Gupta, Sandeep YR 2024 SN 2375-1053 K1 Time-frequency analysis K1 Technological innovation K1 Wires K1 Built-in self-test K1 Very large scale integration K1 Delays K1 Circuit faults K1 RSFQ K1 Design for testability (DFT) K1 Built in self test (BIST) SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/VTS60656.2024.10538849 DO https://doi.org/10.1109/VTS60656.2024.10538849 SF ELIB - SuUB Bremen
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