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1 Ergebnisse
1
Addressing the Combined Effect of Transistor and Interconne..:
, In:
2024 IEEE 42nd VLSI Test Symposium (VTS)
,
Zhang, Zhe
;
Mayahinia, Mahta
;
Weis, Christian
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/VTS60656.2024.10538862
RT T1
2024 IEEE 42nd VLSI Test Symposium (VTS)
: T1
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
UL https://suche.suub.uni-bremen.de/peid=ieee-10538862&Exemplar=1&LAN=DE A1 Zhang, Zhe A1 Mayahinia, Mahta A1 Weis, Christian A1 Wehn, Norbert A1 Tahoori, Mehdi A1 Nassif, Sani A1 Tshagharyan, Grigor A1 Harutyunyan, Gurgen A1 Zorian, Yervant YR 2024 SN 2375-1053 K1 Negative bias temperature instability K1 Analytical models K1 Thermal variables control K1 Computational modeling K1 Random access memory K1 Integrated circuit interconnections K1 Aging K1 noise sensitivity analysis K1 alternative circuit styles K1 SRAM K1 NBTI K1 EM SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/VTS60656.2024.10538862 DO https://doi.org/10.1109/VTS60656.2024.10538862 SF ELIB - SuUB Bremen
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