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1 Ergebnisse
1
Research on IC chip reliability testing: the influence of a..:
, In:
13th International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE 2023)
,
Sun, K.
;
Liu, M.
;
Wei, H.
... - p. None , 2023
Link:
https://doi.org/10.1049/icp.2023.1718
RT T1 <cTitle>13th International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE 2023)</cTitle>: T1 <Title>Research on IC chip reliability testing: the influence of ambient on IC junction temperature</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10542035&Exemplar=1&LAN=DE A1 Sun, K. A1 Liu, M. A1 Wei, H. A1 Liang, C. A1 Liu, Z. A1 Cui, H. A1 Shen, Y. A1 Wu, D. YR 2023 SP None LK http://dx.doi.org/https://doi.org/10.1049/icp.2023.1718 DO https://doi.org/10.1049/icp.2023.1718 SF ELIB - SuUB Bremen
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