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1 Ergebnisse
1
Physical Analysis of Lateral-BTBT Induced GIDL Current in G..:
, In:
2024 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream)
,
Rajawat, Vandana Singh
;
Kumar, Ajay
;
Choudhary, Bharat
- p. 1-5 , 2024
Link:
https://doi.org/10.1109/eStream61684.2024.10542601
RT T1
2024 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream)
: T1
Physical Analysis of Lateral-BTBT Induced GIDL Current in GaN-Based FinFET Devices
UL https://suche.suub.uni-bremen.de/peid=ieee-10542601&Exemplar=1&LAN=DE A1 Rajawat, Vandana Singh A1 Kumar, Ajay A1 Choudhary, Bharat YR 2024 SN 2690-8506 K1 Power demand K1 Doping K1 Tunneling K1 Logic gates K1 FinFETs K1 High-k dielectric materials K1 Leakage currents K1 GIDL K1 High-k dielectric K1 Lateral-BTBT K1 GaN K1 ION/IOFF ratio SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/eStream61684.2024.10542601 DO https://doi.org/10.1109/eStream61684.2024.10542601 SF ELIB - SuUB Bremen
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