I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Minimization of Electric field Stress in Three phase gas in..:
, In:
2024 10th International Conference on Communication and Signal Processing (ICCSP)
,
Subrahmanyam, Katta V
;
Rosalina, K Mercy
- p. 632-637 , 2024
Link:
https://doi.org/10.1109/ICCSP60870.2024.10543697
RT T1 <cTitle>2024 10th International Conference on Communication and Signal Processing (ICCSP)</cTitle>: T1 <Title>Minimization of Electric field Stress in Three phase gas insulated busduct with FGM bulb type spacer using metal inserts under Void defect</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10543697&Exemplar=1&LAN=DE A1 Subrahmanyam, Katta V A1 Rosalina, K Mercy YR 2024 SN 2836-1873 K1 Electric potential K1 Metals K1 Switches K1 Signal processing K1 Insulators K1 Conductors K1 Power systems K1 Gas insulated busduct K1 Bulb type spacer K1 Electric Field Stress (Estress) K1 Triple Junction(TJ) K1 Metal Insert(MI) SP 632 OP 637 LK http://dx.doi.org/https://doi.org/10.1109/ICCSP60870.2024.10543697 DO https://doi.org/10.1109/ICCSP60870.2024.10543697 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
