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1 Ergebnisse
1
Using BERT Pre-Trained Image Transformers to Identify Poten..:
, In:
2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
,
Jen, En
;
Ting, Yiju
;
Chen, Boris
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ASMC61125.2024.10545454
RT T1 <cTitle>2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)</cTitle>: T1 <Title>Using BERT Pre-Trained Image Transformers to Identify Potential Parametric Wafer Map Defects</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10545454&Exemplar=1&LAN=DE A1 Jen, En A1 Ting, Yiju A1 Chen, Boris A1 Jan, CH A1 Huang, Lester A1 Lin, ChingYu A1 Wu, Milton A1 Feng, Anna A1 Wen, Charless A1 Chen, HW A1 Yeh, Jason A1 Lai, Citi YR 2024 SN 2376-6697 K1 Semiconductor device modeling K1 Visualization K1 Root cause analysis K1 Noise K1 Semiconductor device manufacture K1 Transformers K1 Foundries K1 BEIT K1 DBSCAN K1 RMA K1 BERT K1 image transformer K1 parametric wafer maps SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ASMC61125.2024.10545454 DO https://doi.org/10.1109/ASMC61125.2024.10545454 SF ELIB - SuUB Bremen
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