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1
Selective Auto-Labeling for Deep Learning-Based Domain-Spec..:
, In:
2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
,
Park, Jisoo
;
Ki, Wanwook
;
Lee, Yongjun
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ASMC61125.2024.10545468
RT T1 <cTitle>2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)</cTitle>: T1 <Title>Selective Auto-Labeling for Deep Learning-Based Domain-Specific Image Classification in Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10545468&Exemplar=1&LAN=DE A1 Park, Jisoo A1 Ki, Wanwook A1 Lee, Yongjun A1 Choi, Minjae A1 Park, Ji Jiyeon A1 Park, Jaeyong A1 Kim, Younghoon YR 2024 SN 2376-6697 K1 Training K1 Technological innovation K1 Process control K1 Machine learning K1 Semiconductor device manufacture K1 Semiconductor process modeling K1 Maintenance K1 Domain adaptation K1 semi-supervised learning K1 auto-labeling K1 confidence SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ASMC61125.2024.10545468 DO https://doi.org/10.1109/ASMC61125.2024.10545468 SF ELIB - SuUB Bremen
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