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1 Ergebnisse
1
Semiconductor Traceability: Die Annotations Patterning by M..:
, In:
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
,
Varga, K.
;
Holly, R.
;
Zenger, T.
... - p. 1-2 , 2024
Link:
https://doi.org/10.1109/VLSITSA60681.2024.10546369
RT T1 <cTitle>2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)</cTitle>: T1 <Title>Semiconductor Traceability: Die Annotations Patterning by Maskless Exposure Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546369&Exemplar=1&LAN=DE A1 Varga, K. A1 Holly, R. A1 Zenger, T. A1 Spitzer, A. A1 Bogelsack, F. A1 Uhrmann, T. A1 Vanclooster, S. A1 Reybrouck, M. A1 Janssen, D. A1 Van Herck, N. A1 Vandevyvere, M. YR 2024 K1 Manufacturing processes K1 Codes K1 Annotations K1 Very large scale integration K1 Packaging K1 Software K1 Distance measurement SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSITSA60681.2024.10546369 DO https://doi.org/10.1109/VLSITSA60681.2024.10546369 SF ELIB - SuUB Bremen
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