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1 Ergebnisse
1
Pattern Generation for Efficient Acceptability Verification..:
, In:
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
,
Chao, Wei-Ji
;
Kourfali, Alexandra
;
Lylina, Natalia
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/VLSITSA60681.2024.10546386
RT T1 <cTitle>2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)</cTitle>: T1 <Title>Pattern Generation for Efficient Acceptability Verification of Approximate Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546386&Exemplar=1&LAN=DE A1 Chao, Wei-Ji A1 Kourfali, Alexandra A1 Lylina, Natalia A1 Wu, Jun-Tsung A1 Yang, Jing-An A1 Wang, Chih-Hao A1 Hsieh, Tong-Yu A1 Wunderlich, Hans-Joachim YR 2024 K1 Measurement K1 Image quality K1 Power demand K1 Costs K1 Design methodology K1 Transform coding K1 Very large scale integration K1 Approximate computing K1 verification K1 acceptability K1 image quality assessment K1 JPEG2000 SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSITSA60681.2024.10546386 DO https://doi.org/10.1109/VLSITSA60681.2024.10546386 SF ELIB - SuUB Bremen
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