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1
A Study of Physical Unclonable Function by Dielectric Break..:
, In:
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
,
Lin, Geng-Shiu
;
King, Ya-Chin
;
Lin, Chrong-Jung
- p. 1-2 , 2024
Link:
https://doi.org/10.1109/VLSITSA60681.2024.10546409
RT T1
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
: T1
A Study of Physical Unclonable Function by Dielectric Breakdown in High-κ Metal Gate Device
UL https://suche.suub.uni-bremen.de/peid=ieee-10546409&Exemplar=1&LAN=DE A1 Lin, Geng-Shiu A1 King, Ya-Chin A1 Lin, Chrong-Jung YR 2024 K1 Resistance K1 Metals K1 Logic gates K1 Very large scale integration K1 Physical unclonable function K1 Dielectric breakdown K1 Arrays K1 dielectric breakdown K1 high-κ metal gate K1 physical unclonable function SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSITSA60681.2024.10546409 DO https://doi.org/10.1109/VLSITSA60681.2024.10546409 SF ELIB - SuUB Bremen
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