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1 Ergebnisse
1
Extremely High Noise Margin and Low Leakage in ULP Circuits..:
, In:
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
,
Semwal, Sandeep
;
Nirala, Rohit Kumar
;
Gupta, Manish
. - p. 1-2 , 2024
Link:
https://doi.org/10.1109/VLSITSA60681.2024.10546420
RT T1 <cTitle>2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)</cTitle>: T1 <Title>Extremely High Noise Margin and Low Leakage in ULP Circuits with NCFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546420&Exemplar=1&LAN=DE A1 Semwal, Sandeep A1 Nirala, Rohit Kumar A1 Gupta, Manish A1 Kranti, Abhinav YR 2024 K1 Analytical models K1 Thermal factors K1 Noise K1 Switches K1 Very large scale integration K1 Threshold voltage K1 Inverters SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSITSA60681.2024.10546420 DO https://doi.org/10.1109/VLSITSA60681.2024.10546420 SF ELIB - SuUB Bremen
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