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1 Ergebnisse
1
Effect of Passivation on BEOL-Compatible Oxide Semiconducto..:
, In:
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
,
Kuo, Chi-Yuan
;
Lo, Tsung-Tien
;
Chiu, Yun-Ping
... - p. 1-2 , 2024
Link:
https://doi.org/10.1109/VLSITSA60681.2024.10546465
RT T1 <cTitle>2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)</cTitle>: T1 <Title>Effect of Passivation on BEOL-Compatible Oxide Semiconductor Transistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546465&Exemplar=1&LAN=DE A1 Kuo, Chi-Yuan A1 Lo, Tsung-Tien A1 Chiu, Yun-Ping A1 Lin, Wei-Chen A1 Liao, Hsien-Yi A1 Tsai, Chi-Hang A1 Lu, Sheng-Chia A1 Chen, Hsin-Chu A1 Huang, Haw-Tyng A1 Yeh, Po-Chun A1 Wu, Yuh-Renn A1 Wu, Chih-I YR 2024 K1 Semiconductor device measurement K1 Powders K1 Scalability K1 Very large scale integration K1 Threshold voltage K1 Thin film transistors K1 Transistors SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSITSA60681.2024.10546465 DO https://doi.org/10.1109/VLSITSA60681.2024.10546465 SF ELIB - SuUB Bremen
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