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1 Ergebnisse
1
Value-Driven Mixed-Precision Quantization for Patch-Based I..:
, In:
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Tao, Wei
;
He, Shenglin
;
Lu, Kai
... - p. 1-6 , 2024
Link:
https://doi.org/10.23919/DATE58400.2024.10546541
RT T1 <cTitle>2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Value-Driven Mixed-Precision Quantization for Patch-Based Inference on Microcontrollers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546541&Exemplar=1&LAN=DE A1 Tao, Wei A1 He, Shenglin A1 Lu, Kai A1 Qu, Xiaoyang A1 Li, Guokuan A1 Wan, Jiguang A1 Wang, Jianzong A1 Xiao, Jing YR 2024 SN 1558-1101 K1 Training K1 Measurement K1 Quantization (signal) K1 Microcontrollers K1 Computational modeling K1 Search methods K1 Neural networks K1 microcontroller K1 deep learning K1 patch-based inference K1 outlier value K1 mixed-precision quantization search SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE58400.2024.10546541 DO https://doi.org/10.23919/DATE58400.2024.10546541 SF ELIB - SuUB Bremen
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