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1 Ergebnisse
1
VACSEM: Verifying Average Errors in Approximate Circuits Us..:
, In:
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Meng, Chang
;
Wang, Hanyu
;
Mai, Yuqi
.. - p. 1-6 , 2024
Link:
https://doi.org/10.23919/DATE58400.2024.10546819
RT T1 <cTitle>2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>VACSEM: Verifying Average Errors in Approximate Circuits Using Simulation-Enhanced Model Counting</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10546819&Exemplar=1&LAN=DE A1 Meng, Chang A1 Wang, Hanyu A1 Mai, Yuqi A1 Qian, Weikang A1 De Micheli, Giovanni YR 2024 SN 1558-1101 K1 Computational modeling K1 Circuits K1 Measurement uncertainty K1 Approximate computing K1 Delays K1 Integrated circuit modeling K1 formal verification K1 approximate computing K1 average error K1 simulation K1 model counting SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE58400.2024.10546819 DO https://doi.org/10.23919/DATE58400.2024.10546819 SF ELIB - SuUB Bremen
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