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1 Ergebnisse
1
Large Language Models for Test-Free Fault Localization:
, In:
2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE)
,
Yang, Aidan Z.H.
;
Goues, Claire Le
;
Martins, Ruben
. - p. 165-176 , 2024
Link:
https://doi.org/10.1145/3597503.3623342
RT T1 <cTitle>2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE)</cTitle>: T1 <Title>Large Language Models for Test-Free Fault Localization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10548193&Exemplar=1&LAN=DE A1 Yang, Aidan Z.H. A1 Goues, Claire Le A1 Martins, Ruben A1 Hellendoorn, Vincent J. YR 2024 SN 1558-1225 K1 Location awareness K1 Deep learning K1 Training K1 Adaptation models K1 Codes K1 Computer bugs K1 Manuals K1 Software and its engineering → Software functional properties K1 Computing methodologies → Neural networks SP 165 OP 176 LK http://dx.doi.org/https://doi.org/10.1145/3597503.3623342 DO https://doi.org/10.1145/3597503.3623342 SF ELIB - SuUB Bremen
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