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Investigation of Transients in Induction Current Sensors Ba..:
, In:
2024 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)
,
Mikhaylov, V. V.
;
Kaun, O. Y.
- p. 944-949 , 2024
Link:
https://doi.org/10.1109/ICIEAM60818.2024.10553770
RT T1 <cTitle>2024 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)</cTitle>: T1 <Title>Investigation of Transients in Induction Current Sensors Based on the Rogovsky Coil</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10553770&Exemplar=1&LAN=DE A1 Mikhaylov, V. V. A1 Kaun, O. Y. YR 2024 K1 Coils K1 Semiconductor device measurement K1 Power measurement K1 Magnetic field measurement K1 Shape K1 Current measurement K1 Windings K1 Rogovsky sensor K1 transient in the secondary circuit K1 measurement of non-sinusoidal currents SP 944 OP 949 LK http://dx.doi.org/https://doi.org/10.1109/ICIEAM60818.2024.10553770 DO https://doi.org/10.1109/ICIEAM60818.2024.10553770 SF ELIB - SuUB Bremen
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