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1
Exploring Data Cleanness in Defects4J and Its Influence on ..:
, In:
2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
,
Rafi, Md Nakhla
;
Chen, An Ran
;
Chen, Tse-Hsun Peter
. - p. 386-387 , 2024
Link:
https://doi.org/10.1145/3639478.3643125
RT T1 <cTitle>2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)</cTitle>: T1 <Title>Exploring Data Cleanness in Defects4J and Its Influence on Fault Localization Efficiency</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10554933&Exemplar=1&LAN=DE A1 Rafi, Md Nakhla A1 Chen, An Ran A1 Chen, Tse-Hsun Peter A1 Wang, Shaohua YR 2024 SN 2574-1934 K1 Location awareness K1 Software testing K1 Accuracy K1 Computer bugs K1 Benchmark testing K1 Mirrors K1 Stress SP 386 OP 387 LK http://dx.doi.org/https://doi.org/10.1145/3639478.3643125 DO https://doi.org/10.1145/3639478.3643125 SF ELIB - SuUB Bremen
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