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1 Ergebnisse
1
Feature Points based Residual UNet with Nonlinear Decay Rat..:
, In:
2024 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Hsieh, An-Ting
;
Chiu, Ching-Te
;
Chen, Tsai-Chieh
.. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ISCAS58744.2024.10558157
RT T1 <cTitle>2024 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>Feature Points based Residual UNet with Nonlinear Decay Rate for Partial Wet Fingerprint Restoration and Recognition</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10558157&Exemplar=1&LAN=DE A1 Hsieh, An-Ting A1 Chiu, Ching-Te A1 Chen, Tsai-Chieh A1 Hsu, Mao-Hsiu A1 Wenyong, Long YR 2024 SN 2158-1525 K1 Image recognition K1 Accuracy K1 Circuits and systems K1 Image matching K1 Fingerprint recognition K1 Feature extraction K1 Image restoration K1 wet fingerprint restoration K1 partial fingerprints K1 residual learning K1 feature fusion K1 real-world dataset SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS58744.2024.10558157 DO https://doi.org/10.1109/ISCAS58744.2024.10558157 SF ELIB - SuUB Bremen
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