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1 Ergebnisse
1
Highly Reliable PUF Circuits Using Efficient Post-Processin..:
, In:
2024 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Tseng, Yu-Hsiang
;
Yang, Shao-Hong
;
Liu, Tsung-Te
- p. 1-5 , 2024
Link:
https://doi.org/10.1109/ISCAS58744.2024.10558347
RT T1 <cTitle>2024 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>Highly Reliable PUF Circuits Using Efficient Post-Processing Stabilization Technique</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10558347&Exemplar=1&LAN=DE A1 Tseng, Yu-Hsiang A1 Yang, Shao-Hong A1 Liu, Tsung-Te YR 2024 SN 2158-1525 K1 Ring oscillators K1 Temperature distribution K1 Manufacturing processes K1 Circuits and systems K1 Bit error rate K1 Noise K1 Physical unclonable function K1 Weak PUF K1 Ring Oscillator K1 FPGA K1 Reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS58744.2024.10558347 DO https://doi.org/10.1109/ISCAS58744.2024.10558347 SF ELIB - SuUB Bremen
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