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1 Ergebnisse
1
A 0.5 μm2 2-T Thin-Oxide OTP Antifuse with Reliability Enha..:
, In:
2024 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Li, Haoyu
;
Wang, Dong
;
Zhou, Jiazheng
.. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ISCAS58744.2024.10558565
RT T1 <cTitle>2024 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>A 0.5 μm2 2-T Thin-Oxide OTP Antifuse with Reliability Enhanced by Auto Shut-off Program Logic for Low-Power Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10558565&Exemplar=1&LAN=DE A1 Li, Haoyu A1 Wang, Dong A1 Zhou, Jiazheng A1 Liu, Junhua A1 Liao, Huailin YR 2024 SN 2158-1525 K1 Programmable logic arrays K1 Voltage K1 Programming K1 CMOS process K1 Timing K1 Logic K1 Transistors K1 Thin-Oxide K1 Antifuse K1 OTP K1 Memory Array K1 Low Power K1 RFID SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS58744.2024.10558565 DO https://doi.org/10.1109/ISCAS58744.2024.10558565 SF ELIB - SuUB Bremen
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