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1 Ergebnisse
1
Methodologies for Device Characterization in Cryogenic Temp..:
, In:
2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)
,
Roknian, Noam
;
Shoshan, Yonatan
;
Stanger, Inbal
... - p. 1-4 , 2024
Link:
https://doi.org/10.1109/PRIME61930.2024.10559674
RT T1 <cTitle>2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)</cTitle>: T1 <Title>Methodologies for Device Characterization in Cryogenic Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10559674&Exemplar=1&LAN=DE A1 Roknian, Noam A1 Shoshan, Yonatan A1 Stanger, Inbal A1 Goldzweig, Menachem A1 Weizmann, Yoav A1 Teman, Adam A1 Charbon, Edoardo A1 Fish, Alexander YR 2024 K1 Temperature distribution K1 Cryogenics K1 Very large scale integration K1 Reliability engineering K1 Complexity theory K1 Transistors K1 Task analysis K1 Cryogenic Temperatures K1 Characterization K1 Methodology K1 Measurements K1 Dipstick K1 Cryogenic Chamber SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/PRIME61930.2024.10559674 DO https://doi.org/10.1109/PRIME61930.2024.10559674 SF ELIB - SuUB Bremen
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