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1 Ergebnisse
1
A 55nm, Multiple-Loop, Fast-Transient, −76.2 dB Worst-Case ..:
, In:
2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)
,
Spreafico, Francesco
;
Sant, Luca
;
Gaggl, Richard
. - p. 1-4 , 2024
Link:
https://doi.org/10.1109/PRIME61930.2024.10559736
RT T1 <cTitle>2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)</cTitle>: T1 <Title>A 55nm, Multiple-Loop, Fast-Transient, −76.2 dB Worst-Case PSRR LDO for High-End Audio Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10559736&Exemplar=1&LAN=DE A1 Spreafico, Francesco A1 Sant, Luca A1 Gaggl, Richard A1 Baschirotto, Andrea YR 2024 K1 Resistors K1 Resistance K1 Transient response K1 Switches K1 Regulation K1 Threshold voltage K1 Stability analysis K1 folded-flipped-voltage-follower K1 PSRR K1 fast transient K1 adaptive biasing K1 variable resistance K1 multiple-loop SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/PRIME61930.2024.10559736 DO https://doi.org/10.1109/PRIME61930.2024.10559736 SF ELIB - SuUB Bremen
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