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Analysis of Different LFSRs for VLSI IC Testing:

, In: 2024 IEEE 4th International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA),
Gupta, Shubham ; Goyal, Garima ; Rana, Ashwani Kumar - p. 1-5 , 2024
Link: https://doi.org/10.1109/VLSISATA61709.2024.10560316