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1 Ergebnisse
1
Fault Prior-guided White-box Model towards Interpretable Di..:
, In:
2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
,
Zheng, Yuan
;
Li, Weihua
;
Chen, Zhuyun
.. - p. 1-6 , 2024
Link:
https://doi.org/10.1109/I2MTC60896.2024.10560974
RT T1 <cTitle>2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)</cTitle>: T1 <Title>Fault Prior-guided White-box Model towards Interpretable Discriminant Feature Extraction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10560974&Exemplar=1&LAN=DE A1 Zheng, Yuan A1 Li, Weihua A1 Chen, Zhuyun A1 Lin, Huibin A1 He, Guolin YR 2024 SN 2642-2077 K1 Training K1 Adaptation models K1 Adaptive systems K1 Transforms K1 Feature extraction K1 Wavelet analysis K1 Robustness K1 Interpretability K1 Laplace wavelet K1 impact feature extraction SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/I2MTC60896.2024.10560974 DO https://doi.org/10.1109/I2MTC60896.2024.10560974 SF ELIB - SuUB Bremen
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