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1 Ergebnisse
1
Accuracy Impact of Increased Measurement Quality when using..:
, In:
2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
,
Lundgren, Jan
;
Jiang, Meng
;
Laino, Valter
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/I2MTC60896.2024.10561016
RT T1 <cTitle>2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)</cTitle>: T1 <Title>Accuracy Impact of Increased Measurement Quality when using Pretrained Networks for Classification</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10561016&Exemplar=1&LAN=DE A1 Lundgren, Jan A1 Jiang, Meng A1 Laino, Valter A1 Gallo, Vincenzo A1 Carratu, Marco A1 Nnonyelu, Chibuzo Joseph YR 2024 SN 2642-2077 K1 Accuracy K1 Computational modeling K1 Neural networks K1 Training data K1 Metrology K1 Data models K1 Convolutional neural networks K1 Data Quality K1 Pretrained K1 Neural Networks K1 Classification K1 Machine Learning K1 Deep Learning K1 SNR SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/I2MTC60896.2024.10561016 DO https://doi.org/10.1109/I2MTC60896.2024.10561016 SF ELIB - SuUB Bremen
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