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1 Ergebnisse
1
An Examination of Machine Learning Techniques for Automatin..:
, In:
2024 International Conference on Science Technology Engineering and Management (ICSTEM)
,
Jeyarohini, R.
;
Sathya, R
;
Sellapaandi, S. P.
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ICSTEM61137.2024.10561035
RT T1 <cTitle>2024 International Conference on Science Technology Engineering and Management (ICSTEM)</cTitle>: T1 <Title>An Examination of Machine Learning Techniques for Automating and Optimizing VLSI Design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10561035&Exemplar=1&LAN=DE A1 Jeyarohini, R. A1 Sathya, R A1 Sellapaandi, S. P. A1 Kavitha, P A1 Ramesh, D. Raja A1 Mukherjee, Aparajita YR 2024 K1 Supervised learning K1 Electronics industry K1 Reinforcement learning K1 Manuals K1 Evolutionary computation K1 Very large scale integration K1 Routing K1 Machine Learning K1 VLSI Design K1 Automation K1 Optimization K1 Semiconductor Industry K1 Design Productivity K1 Chip Performance SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICSTEM61137.2024.10561035 DO https://doi.org/10.1109/ICSTEM61137.2024.10561035 SF ELIB - SuUB Bremen
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