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1 Ergebnisse
1
Enhancing Defect Recognition: Convolutional Neural Networks..:
, In:
2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE)
,
Junayed, Muhammad
;
Reza, Tanzeem Tahmeed
;
Islam, Md. Saiful
- p. 1-6 , 2024
Link:
https://doi.org/10.1109/ICAEEE62219.2024.10561853
RT T1 <cTitle>2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE)</cTitle>: T1 <Title>Enhancing Defect Recognition: Convolutional Neural Networks for Silicon Wafer Map Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10561853&Exemplar=1&LAN=DE A1 Junayed, Muhammad A1 Reza, Tanzeem Tahmeed A1 Islam, Md. Saiful YR 2024 K1 Semiconductor device modeling K1 Productivity K1 Accuracy K1 Convolution K1 Neural networks K1 Semiconductor device reliability K1 Predictive models K1 Convolutional Neural Network K1 Semiconductor Wafer defects K1 Gradient-weighted class activation mapping K1 deep learning SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICAEEE62219.2024.10561853 DO https://doi.org/10.1109/ICAEEE62219.2024.10561853 SF ELIB - SuUB Bremen
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