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1 Ergebnisse
1
A Coverage-Oriented Fuzzing Test Method for Embedded Firmwa..:
, In:
2024 10th International Symposium on System Security, Safety, and Reliability (ISSSR)
,
Yang, Wansheng
;
Luo, Hairu
;
Hu, Chi
. - p. 244-250 , 2024
Link:
https://doi.org/10.1109/ISSSR61934.2024.00036
RT T1 <cTitle>2024 10th International Symposium on System Security, Safety, and Reliability (ISSSR)</cTitle>: T1 <Title>A Coverage-Oriented Fuzzing Test Method for Embedded Firmware</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10562136&Exemplar=1&LAN=DE A1 Yang, Wansheng A1 Luo, Hairu A1 Hu, Chi A1 He, Fengjiao YR 2024 SN 2835-2823 K1 Embedded systems K1 Instruments K1 Static analysis K1 Fuzzing K1 Computer crashes K1 Safety K1 Security K1 fuzzing test K1 firmware K1 vulnerabilities K1 coverage-based K1 dynamic instrumentation marked SP 244 OP 250 LK http://dx.doi.org/https://doi.org/10.1109/ISSSR61934.2024.00036 DO https://doi.org/10.1109/ISSSR61934.2024.00036 SF ELIB - SuUB Bremen
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