I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Bayesian Optimization of Large Glass Package Architecture f..:
, In:
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
,
Surillo, Emanuel Torres
;
Sosa, Ramon A.
;
Molina, Christian
... - p. 246-253 , 2024
Link:
https://doi.org/10.1109/ECTC51529.2024.00047
RT T1
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
: T1
Bayesian Optimization of Large Glass Package Architecture for System-Level Reliability in High-Performance Computing Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10564862&Exemplar=1&LAN=DE A1 Surillo, Emanuel Torres A1 Sosa, Ramon A. A1 Molina, Christian A1 Park, Hyunggyu A1 Nimbalkar, Pratik A1 Srirangan, Sriram A1 Dahal, Lila D. A1 Lee, Yongwon A1 Smet, Vanessa YR 2024 SN 2377-5726 K1 Integrated circuit interconnections K1 Glass K1 Materials reliability K1 Computer architecture K1 Reliability engineering K1 Finite element analysis K1 Bayes methods K1 Large glass BGA package K1 system-level reliability K1 warpage mitigation K1 finite element analysis K1 Bayesian optimization SP 246 OP 253 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51529.2024.00047 DO https://doi.org/10.1109/ECTC51529.2024.00047 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)