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1 Ergebnisse
1
A Novel Method for LPDDR5 DRAM Jitter Measurement Through D..:
, In:
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
,
Lee, Manho
;
Cho, Chulhee
;
Lee, Hyeongi
... - p. 1773-1776 , 2024
Link:
https://doi.org/10.1109/ECTC51529.2024.00295
RT T1 <cTitle>2024 IEEE 74th Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>A Novel Method for LPDDR5 DRAM Jitter Measurement Through De-embedding</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10564952&Exemplar=1&LAN=DE A1 Lee, Manho A1 Cho, Chulhee A1 Lee, Hyeongi A1 Park, Sehoon A1 Hong, Wonseok A1 Woo, ByungSuk A1 Choi, Woo-Shin A1 Cho, Young-Chul A1 Sohn, Young-Soo A1 Choi, Jung-Hwan YR 2024 SN 2377-5726 K1 Semiconductor device measurement K1 Power measurement K1 Sockets K1 Oscilloscopes K1 Transfer functions K1 Random access memory K1 Jitter K1 Jitter Measurement K1 Jitter Restoration K1 Low Power Double-Data Rate Memory K1 LPDDR5 K1 2x-thru De-embedding K1 Automatic Test Equipment(ATE) SP 1773 OP 1776 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51529.2024.00295 DO https://doi.org/10.1109/ECTC51529.2024.00295 SF ELIB - SuUB Bremen
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