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1 Ergebnisse
1
Comprehensive Socket Characterization and Correlation for H..:
, In:
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
,
Sriboonlue, Varin
;
Jeon, Yeseul
;
Luevano, Gerardo R.
.. - p. 1768-1772 , 2024
Link:
https://doi.org/10.1109/ECTC51529.2024.00294
RT T1 <cTitle>2024 IEEE 74th Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Comprehensive Socket Characterization and Correlation for High-speed Interface Testing System</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10564984&Exemplar=1&LAN=DE A1 Sriboonlue, Varin A1 Jeon, Yeseul A1 Luevano, Gerardo R. A1 Ferguson, Chris A1 Ochoa, Ennai YR 2024 SN 2377-5726 K1 Semiconductor device measurement K1 Accuracy K1 Sockets K1 Atmospheric modeling K1 Production K1 Predictive models K1 Data models K1 Pogo pin socket K1 Socket modeling K1 model simulation to measurement correlation K1 high speed fixture de-embedding K1 signal integrity SP 1768 OP 1772 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51529.2024.00294 DO https://doi.org/10.1109/ECTC51529.2024.00294 SF ELIB - SuUB Bremen
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