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1 Ergebnisse
1
Deep Convolution Neural Networks for Automatic Detection of..:
, In:
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
,
Zhao, Oliver
;
Suwito, Dominik
;
Lee, Bongsub
.. - p. 491-497 , 2024
Link:
https://doi.org/10.1109/ECTC51529.2024.00083
RT T1 <cTitle>2024 IEEE 74th Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Deep Convolution Neural Networks for Automatic Detection of Defects which Impact Hybrid Bonding Yield</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10565101&Exemplar=1&LAN=DE A1 Zhao, Oliver A1 Suwito, Dominik A1 Lee, Bongsub A1 Workman, Thomas A1 Mirkarimi, Laura YR 2024 SN 2377-5726 K1 Semiconductor device modeling K1 Accuracy K1 Optical microscopy K1 Microscopy K1 Optical imaging K1 Throughput K1 Convolutional neural networks K1 hybrid bonding K1 defect detection K1 convolutional neural network SP 491 OP 497 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51529.2024.00083 DO https://doi.org/10.1109/ECTC51529.2024.00083 SF ELIB - SuUB Bremen
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