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1 Ergebnisse
1
A Unified and Adaptive Continual Learning Method for Featur..:
, In:
2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
,
Chang, Richard
;
Jie, Wang
;
Thakur, Namrata
... - p. 1872-1879 , 2024
Link:
https://doi.org/10.1109/ECTC51529.2024.00314
RT T1 <cTitle>2024 IEEE 74th Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>A Unified and Adaptive Continual Learning Method for Feature Segmentation of Buried Packages in 3D XRM Images</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10565220&Exemplar=1&LAN=DE A1 Chang, Richard A1 Jie, Wang A1 Thakur, Namrata A1 Zhao, Ziyuan A1 Pahwa, Ramanpreet Singh A1 Yang, Xulei YR 2024 SN 2377-5726 K1 Training K1 Semiconductor device modeling K1 Deep learning K1 Three-dimensional displays K1 Accuracy K1 Annotations K1 Computational modeling K1 Deep Learning K1 3D segmentation K1 defect detection K1 continual learning SP 1872 OP 1879 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51529.2024.00314 DO https://doi.org/10.1109/ECTC51529.2024.00314 SF ELIB - SuUB Bremen
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