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1 Ergebnisse
1
A Simplified Bearing Testbed for Evaluating Bearing Current..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Guo, Cheng
;
Yuan, Xibo
;
Xu, Yipu
... - p. 3083-3088 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>A Simplified Bearing Testbed for Evaluating Bearing Current and Degradation in Wide Bandgap Inverter Fed Electric Machines</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567089&Exemplar=1&LAN=DE A1 Guo, Cheng A1 Yuan, Xibo A1 Xu, Yipu A1 Zhou, Wenzhi A1 Liu, Quanrui A1 Zhang, Yonglei A1 Peng, Xin A1 Wang, Kai YR 2024 K1 Degradation K1 Scanning electron microscopy K1 Electric machines K1 Photonic band gap K1 Process control K1 Motors K1 Steady-state K1 Bearing current K1 bearing damage K1 motor bearing K1 testbed SP 3083 OP 3088 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567089 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567089 SF ELIB - SuUB Bremen
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