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1 Ergebnisse
1
Comparison of Two Third-Generation 10 kV SiC MOSFET Die's S..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Nielsen, Morten Rahr
;
Kjar, Martin
;
Zhao, Hongbo
.. - p. 1250-1255 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>Comparison of Two Third-Generation 10 kV SiC MOSFET Die's Switching Performance on a System Level</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567349&Exemplar=1&LAN=DE A1 Nielsen, Morten Rahr A1 Kjar, Martin A1 Zhao, Hongbo A1 Bech, Michael Moller A1 Munk-Nielsen, Stig YR 2024 K1 Performance evaluation K1 Resistance K1 MOSFET K1 Power system measurements K1 Silicon carbide K1 Semiconductor devices K1 Switching loss K1 10 kV SiC MOSFET K1 Engineering Sample K1 System Level Comparison K1 Switching Performance SP 1250 OP 1255 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567349 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567349 SF ELIB - SuUB Bremen
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