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1 Ergebnisse
1
Impact of Circuit Mismatches and Parasitic Parameters on Pa..:
, In:
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
,
Song, Chen
;
Yin, Shan
;
Lin, Jinshu
. - p. 4150-4154 , 2024
Link:
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567..
RT T1 <cTitle>2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)</cTitle>: T1 <Title>Impact of Circuit Mismatches and Parasitic Parameters on Paralleling 650-V E-Mode GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10567423&Exemplar=1&LAN=DE A1 Song, Chen A1 Yin, Shan A1 Lin, Jinshu A1 Li, Hui YR 2024 K1 Inductance K1 Analytical models K1 Layout K1 Switches K1 HEMTs K1 Reliability engineering K1 MODFETs K1 Gallium Nitride (GaN) K1 gate driver design K1 double-pulse test (DPT) K1 paralleling K1 PCB layout SP 4150 OP 4154 LK http://dx.doi.org/https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567423 DO https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567423 SF ELIB - SuUB Bremen
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