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1 Ergebnisse
1
Reliability and Security of AI Hardware:
, In:
2024 IEEE European Test Symposium (ETS)
,
Gnad, Dennis
;
Gotthard, Martin
;
Krautter, Jonas
... - p. 1-10 , 2024
Link:
https://doi.org/10.1109/ETS61313.2024.10567471
RT T1
2024 IEEE European Test Symposium (ETS)
: T1
Reliability and Security of AI Hardware
UL https://suche.suub.uni-bremen.de/peid=ieee-10567471&Exemplar=1&LAN=DE A1 Gnad, Dennis A1 Gotthard, Martin A1 Krautter, Jonas A1 Kritikakou, Angeliki A1 Meyers, Vincent A1 Rech, Paolo A1 Rodriguez Condia, Josie E. A1 Ruospo, Annachiara A1 Sanchez, Ernesto A1 Dos Santos, Fernando Fernandes A1 Sentieys, Olivier A1 Tahoori, Mehdi A1 Tessier, Russell A1 Traiola, Marcello YR 2024 SN 1558-1780 K1 Fluctuations K1 Voltage fluctuations K1 Fault tolerant systems K1 Silicon K1 Software reliability K1 Complexity theory K1 Circuit faults K1 AI accelerators K1 machine learning K1 neural networks K1 hardware reliability K1 fault tolerance K1 hardware security K1 side-channel attacks SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/ETS61313.2024.10567471 DO https://doi.org/10.1109/ETS61313.2024.10567471 SF ELIB - SuUB Bremen
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